Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r 3 (the light does not reflect inside material 2) and r 4 (the light reflects twice inside material 2). The waves of r 3 and r 4 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n 1 , n 2 , and n 3 , the type of interference, the thin-layer thickness L in nanometers, and the wavelength ๐ in nanometers of the light as measured in air. Where ๐ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated. Figure 35-45 n 1 n 2 n 3 Type L ๐ 61 1.32 1.75 1.39 Min 325 62 1.68 1.59 1.50 Max 2nd 342 63 1.40 1.46 1.75 Max 2nd 482 64 1.40 1.46 1.75 Max 210 65 1.60 1.40 1.80 Min 2nd 632 Table 35-3: Transmission Through Thin Layers.
Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r 3 (the light does not reflect inside material 2) and r 4 (the light reflects twice inside material 2). The waves of r 3 and r 4 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n 1 , n 2 , and n 3 , the type of interference, the thin-layer thickness L in nanometers, and the wavelength ๐ in nanometers of the light as measured in air. Where ๐ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated. Figure 35-45 n 1 n 2 n 3 Type L ๐ 61 1.32 1.75 1.39 Min 325 62 1.68 1.59 1.50 Max 2nd 342 63 1.40 1.46 1.75 Max 2nd 482 64 1.40 1.46 1.75 Max 210 65 1.60 1.40 1.80 Min 2nd 632 Table 35-3: Transmission Through Thin Layers.
Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray
r
3
(the light does not reflect inside material 2) and
r
4
(the light reflects twice inside material 2). The waves of
r
3
and
r
4
interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction
n
1
,
n
2
, and
n
3
, the type of interference, the thin-layer thickness L in nanometers, and the wavelength ๐ in nanometers of the light as measured in air. Where ๐ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated.
Checkpoint 4
The figure shows four orientations of an electric di-
pole in an external electric field. Rank the orienta-
tions according to (a) the magnitude of the torque
on the dipole and (b) the potential energy of the di-
pole, greatest first.
(1)
(2)
E
(4)
What is integrated science.
What is fractional distillation
What is simple distillation
19:39 ยท
C
Chegg
1 69%
โ
The compound beam is fixed at ฤ and supported by rollers at A and B. There are pins at C and D. Take
F=1700 lb. (Figure 1)
Figure
800 lb
||-5-
F
600 lb
ุจุชุง
D
E
C
BO
10 ft 5 ft 4 ft-โโ 6 ft โ 5 ft-
Solved Part A The compound
beam is fixed at E and...
Hรฌnh แบฃnh cรณ thแป cรณ bแบฃn quyแปn. Tรฌm hiแปu thรชm
Problem
A-12
% Chia sแบป
kip
800 lb
Truy cแบญp )
D Lฦฐu
of
C
600 lb
|-sa+ 10ft 5ft 4ft6ft
D
E
5 ft-
Trying
Cheaa
Nhแปฏng kแบฟt quแบฃ nร y cรณ
hแปฏu รญch khรดng?
There are pins at C and D To F-1200 Egue!)
Chegg
Solved The compound b...
Cรณ Khรดng โ
|||
Chegg
10
ืื
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