41 through 52 GO 43, 51 SSM 47, 51 Reflection by thin layers . In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r 1 and r 2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-2 refers to the indexes of refraction n 1 , n 2 , and n 3 , the type of interference, the thin-layer thickness L in nanometers, and the wavelength λ in nanometers of the light as measured in air. Where λ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated. Figure 35-42 Problems 41 through 52 Table 35-2 Problems 41 through 52: Reflection by Thin Layers. See the setup for these problems. n 1 n 2 n 3 Type L λ 41 1.68 1.59 1.50 min 2nd 342
41 through 52 GO 43, 51 SSM 47, 51 Reflection by thin layers . In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r 1 and r 2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-2 refers to the indexes of refraction n 1 , n 2 , and n 3 , the type of interference, the thin-layer thickness L in nanometers, and the wavelength λ in nanometers of the light as measured in air. Where λ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated. Figure 35-42 Problems 41 through 52 Table 35-2 Problems 41 through 52: Reflection by Thin Layers. See the setup for these problems. n 1 n 2 n 3 Type L λ 41 1.68 1.59 1.50 min 2nd 342
41 through 52 GO 43, 51 SSM 47, 51 Reflection by thin layers. In Fig. 35-42, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) The waves of rays r1 and r2 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-2 refers to the indexes of refraction n1, n2, and n3, the type of interference, the thin-layer thickness L in nanometers, and the wavelength λ in nanometers of the light as measured in air. Where λ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated.
Figure 35-42 Problems 41 through 52
Table 35-2 Problems 41 through 52: Reflection by Thin Layers. See the setup for these problems.
simple diagram to illustrate the setup for each law- coulombs law and biot savart law
A circular coil with 100 turns and a radius of 0.05 m is placed in a magnetic field that changes at auniform rate from 0.2 T to 0.8 T in 0.1 seconds. The plane of the coil is perpendicular to the field.• Calculate the induced electric field in the coil.• Calculate the current density in the coil given its conductivity σ.
An L-C circuit has an inductance of 0.410 H and a capacitance of 0.250 nF . During the current oscillations, the maximum current in the inductor is 1.80 A . What is the maximum energy Emax stored in the capacitor at any time during the current oscillations? How many times per second does the capacitor contain the amount of energy found in part A? Please show all steps.
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