Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) arepowerful tools for imaging the micro- and nano-structure of a material.(a) Which technique provides higher imaging resolution, SEM or TEM?(b) Why does this technique provide higher resolution? Describe your reasoning.(c) A polymer sample is mounted on a solid metal stub and coated with a conductivelayer. Which electron microscopy technique is the sample prepared for?(d) Why do we need a conductive coating on the polymer sample? Explain in terms ofboth the material and the imaging technique.(e) What information could Energy Dispersive X-ray (EDX) spectroscopy tell us aboutthe sample?(f) Atomic Force Microscopy (AFM) enables high resolution surface imaging andmeasuring surface properties of samples. Describe one way that this (stiffnessmapping) procedure can be done?

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Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) are powerful tools for imaging the micro- and nano-structure of a material. (a) Which technique provides higher imaging resolution, SEM or TEM? (b) Why does this technique provide higher resolution? Describe your reasoning.

Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) are powerful tools for imaging the micro- and nano-structure of a material. (a) Which technique provides higher imaging resolution, SEM or TEM? (b) Why does this technique provide higher resolution? Describe your reasoning.

Elements Of Electromagnetics

7th Edition

ISBN:9780190698614

Author:Sadiku, Matthew N. O.

Publisher:Sadiku, Matthew N. O.

ChapterMA: Math Assessment

Section: Chapter Questions

Problem 1.1MA

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