Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r 3 (the light does not reflect inside material 2) and r 4 (the light reflects twice inside material 2). The waves of r 3 and r 4 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n 1 , n 2 , and n 3 , the type of interference, the thin-layer thickness L in nanometers, and the wavelength ๐ in nanometers of the light as measured in air. Where ๐ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated. Figure 35-45 n 1 n 2 n 3 Type L ๐ 61 1.32 1.75 1.39 Min 325 62 1.68 1.59 1.50 Max 2nd 342 63 1.40 1.46 1.75 Max 2nd 482 64 1.40 1.46 1.75 Max 210 65 1.60 1.40 1.80 Min 2nd 632 Table 35-3: Transmission Through Thin Layers.
Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray r 3 (the light does not reflect inside material 2) and r 4 (the light reflects twice inside material 2). The waves of r 3 and r 4 interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction n 1 , n 2 , and n 3 , the type of interference, the thin-layer thickness L in nanometers, and the wavelength ๐ in nanometers of the light as measured in air. Where ๐ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated. Figure 35-45 n 1 n 2 n 3 Type L ๐ 61 1.32 1.75 1.39 Min 325 62 1.68 1.59 1.50 Max 2nd 342 63 1.40 1.46 1.75 Max 2nd 482 64 1.40 1.46 1.75 Max 210 65 1.60 1.40 1.80 Min 2nd 632 Table 35-3: Transmission Through Thin Layers.
Fig. 35-43, light is incident perpendicularly on a thin layer of material 2 that lies between (thicker) materials 1 and 3. (The rays are tilted only for clarity.) Part of the light ends up in material 3 as ray
r
3
(the light does not reflect inside material 2) and
r
4
(the light reflects twice inside material 2). The waves of
r
3
and
r
4
interfere, and here we consider the type of interference to be either maximum (max) or minimum (min). For this situation, each problem in Table 35-3 refers to the indexes of refraction
n
1
,
n
2
, and
n
3
, the type of interference, the thin-layer thickness L in nanometers, and the wavelength ๐ in nanometers of the light as measured in air. Where ๐ is missing, give the wavelength that is in the visible range. Where L is missing, give the second least thickness or the third least thickness as indicated.
6. Bending a lens in OpticStudio or OSLO. In either package, create a BK7 singlet lens of 10 mm semi-diameter
and with 10 mm thickness. Set the wavelength to the (default) 0.55 microns and a single on-axis field point at
infinite object distance. Set the image distance to 200 mm. Make the first surface the stop insure that the lens
is fully filled (that is, that the entrance beam has a radius of 10 mm). Use the lens-maker's equation to
calculate initial glass curvatures assuming you want a symmetric, bi-convex lens with an effective focal length
of 200 mm. Get this working and examine the RMS spot size using the "Text" tab of the Spot Diagram analysis
tab (OpticStudio) or the Spd command of the text widnow (OSLO). You should find the lens is far from
diffraction limited, with a spot size of more than 100 microns.
Now let's optimize this lens. In OpticStudio, create a default merit function optimizing on spot size.Then insert
one extra line at the top of the merit function. Assign theโฆ
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