A bin of 5 transistors is known to contain 2 that are defective. The transistors are to be tested, one at a time, until the defective ones are identified. Denote by X the number of tests made until the first defect is identified and by Y the number of additional tests until the second defect is identified. (a) Depict the points and corresponding probabilities on a graph similar to file attached below. (b) Give the marginal pmfs in the “margins.”
A bin of 5 transistors is known to contain 2 that are defective. The transistors are to be tested, one at a time, until the defective ones are identified. Denote by X the number of tests made until the first defect is identified and by Y the number of additional tests until the second defect is identified. (a) Depict the points and corresponding probabilities on a graph similar to file attached below. (b) Give the marginal pmfs in the “margins.”
MATLAB: An Introduction with Applications
6th Edition
ISBN:9781119256830
Author:Amos Gilat
Publisher:Amos Gilat
Chapter1: Starting With Matlab
Section: Chapter Questions
Problem 1P
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2. A bin of 5 transistors is known to contain 2 that are defective. The transistors are to be
tested, one at a time, until the defective ones are identified. Denote by X the number of tests made until
the first defect is identified and by Y the number of additional tests until the second defect is identified.
(a) Depict the points and corresponding
(b) Give the marginal pmfs in the “margins.”
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