6.6. A bin of 5 transistors is known to contain 2 that are defective. The transistors are to be tested, one at a time, until the defective ones are identified. Denote by N₁ the number of tests made until the first defective is identified and by N₂ the number of additional tests until the second defective is identi- fied. Find the joint probability mass function of N₁ and N₂.

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Chapter1: Combinatorial Analysis
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6.6. A bin of 5 transistors is known to contain 2 that
are defective. The transistors are to be tested, one
at a time, until the defective ones are identified.
Denote by N₁ the number of tests made until the
first defective is identified and by N₂ the number of
additional tests until the second defective is identi-
fied. Find the joint probability mass function of N₁
and N₂.
Transcribed Image Text:6.6. A bin of 5 transistors is known to contain 2 that are defective. The transistors are to be tested, one at a time, until the defective ones are identified. Denote by N₁ the number of tests made until the first defective is identified and by N₂ the number of additional tests until the second defective is identi- fied. Find the joint probability mass function of N₁ and N₂.
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