1.7 The resistance of the semiconductor sample in Fig. P1.7 is measured between the two contacts as a function of wafer thickness t. The results are: t (μm) 200 R (2) 318.3 400 623.9 600 800 1000 929.5 1235.1 1540.7 ρ Fig. P1.7 Determine the resistivity p in §. cm and the specific contact resistance pc in 2. cm² 0.01 cm. Assume the current is confined to the area of the contact, shown by the shaded region. The contact is circular with the contact resistance given by Pc/A, where A is the contact area. for d = Re =

1.7 The resistance of the semiconductor sample in Fig. P1.7 is measured between the two contacts as a function of wafer thickness t. The results are: t (μm) 200 R (2) 318.3 400 623.9 600 800 1000 929.5 1235.1 1540.7 ρ Fig. P1.7 Determine the resistivity p in §. cm and the specific contact resistance pc in 2. cm² 0.01 cm. Assume the current is confined to the area of the contact, shown by the shaded region. The contact is circular with the contact resistance given by Pc/A, where A is the contact area. for d = Re =

Power System Analysis and Design (MindTap Course List)

6th Edition

ISBN:9781305632134

Author:J. Duncan Glover, Thomas Overbye, Mulukutla S. Sarma

Publisher:J. Duncan Glover, Thomas Overbye, Mulukutla S. Sarma

Chapter4: Transmission Line Parameters

Section: Chapter Questions

Problem 4.2P: The temperature dependence of resistance is also quantified by the relation R2=R1[ 1+(T2T1) ] where...

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