Figure 1 shows a X-ray diffraction pattern from a powdered aluminium sample. Th sample was exposed to X-rays of wavelength 1.542x10-10m from a Cuka X-ray source. Assuming the indexing of the lines shown in the figure is correct and that a lines are a result of first order diffraction, calculate the lattice parameter of the structure in nm. Verify your answer by repeating your measurement with a second line. Note the planar spacing d is related to the lattice parameter a by the equation: a d = √h² + k² + 1² Where h, k and I are the miller indices of the plane
Figure 1 shows a X-ray diffraction pattern from a powdered aluminium sample. Th sample was exposed to X-rays of wavelength 1.542x10-10m from a Cuka X-ray source. Assuming the indexing of the lines shown in the figure is correct and that a lines are a result of first order diffraction, calculate the lattice parameter of the structure in nm. Verify your answer by repeating your measurement with a second line. Note the planar spacing d is related to the lattice parameter a by the equation: a d = √h² + k² + 1² Where h, k and I are the miller indices of the plane
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![Question 5
Figure 1 shows a X-ray diffraction pattern from a powdered aluminium sample. The
sample was exposed to X-rays of wavelength 1.542x10-10m from a Cuka X-ray
source. Assuming the indexing of the lines shown in the figure is correct and that all
lines are a result of first order diffraction, calculate the lattice parameter of the
structure in nm. Verify your answer by repeating your measurement with a second
line. Note the planar spacing d is related to the lattice parameter a by the equation:
a
d =
√h² + k² + 1²
Where h, k and I are the miller indices of the plane.
(111)
100
A=0.1542 nm (CuK-radiation)
(311)
(400) (331)(420)
110 120
Intensity (arbitrary units)
(200)
40
(220)
20
(222)
0
20 30 40
50
60 70 80 90 100
20 (degrees)
Figure 1: X-ray diffraction pattern of powdered aluminium](/v2/_next/image?url=https%3A%2F%2Fcontent.bartleby.com%2Fqna-images%2Fquestion%2F06404c01-4e60-4ba2-a6f0-7f3613f75753%2Fbbb7eca4-072d-4273-849e-7bbc9ecdd5d3%2F0nwm9_processed.jpeg&w=3840&q=75)
Transcribed Image Text:Question 5
Figure 1 shows a X-ray diffraction pattern from a powdered aluminium sample. The
sample was exposed to X-rays of wavelength 1.542x10-10m from a Cuka X-ray
source. Assuming the indexing of the lines shown in the figure is correct and that all
lines are a result of first order diffraction, calculate the lattice parameter of the
structure in nm. Verify your answer by repeating your measurement with a second
line. Note the planar spacing d is related to the lattice parameter a by the equation:
a
d =
√h² + k² + 1²
Where h, k and I are the miller indices of the plane.
(111)
100
A=0.1542 nm (CuK-radiation)
(311)
(400) (331)(420)
110 120
Intensity (arbitrary units)
(200)
40
(220)
20
(222)
0
20 30 40
50
60 70 80 90 100
20 (degrees)
Figure 1: X-ray diffraction pattern of powdered aluminium
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