A silicon sample of unknown doping has the dimensions of W=0.05 cm, A = Area of cross-section = 1.25 x 10-3 /cm2, current (I) = 2.0 mA. Applied magnetic field (B) = 2 x 10-4 Wb/cm2. If a Hall voltage of + 10mV is measured. Current direction and magnetic field directions are shown in Fig. 8, page 52.What is the conductivity type (p-type or n-type)? Calculate Majority carrier concentration Hall coefficient.Determine resistivity from the graph on page 51 (fig. 7) Hall mobility from the resistivity value.

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  1. A silicon sample of unknown doping has the dimensions of W=0.05 cm, A = Area of cross-section = 1.25 x 10-3 /cm2, current (I) = 2.0 mA. Applied magnetic field (B) = 2 x 10-4 Wb/cm2. If a Hall voltage of + 10mV is measured. Current direction and magnetic field directions are shown in Fig. 8, page 52.What is the conductivity type (p-type or n-type)? Calculate Majority carrier concentration Hall coefficient.Determine resistivity from the graph on page 51 (fig. 7) Hall mobility from the resistivity value.

 

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where
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V
Fig. 8 Basic setup to measure carrier concentration using the Hall effect.
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Transcribed Image Text:M Pravallika Documents X Recommendations SP22: EE-257 Sec 01 Ask a Question C Prep for a test - EE 21 X O History O 2: Carrier Transport Ph X + learning.oreilly.com/library/view/semiconductor-devices-physics/9780470537947/09_chap02.html#chap02-sec005 A Update : Apps G Gmail YouTube 9 Марs Maps Solved PROBLEMS... Homework 3 - web... O Problem 4: An intri... P5. The electron co... Four Point Probe Re... E Reading list 1: Energy Bands and Carrier Concentration in Therm... 2: Carrier Transport Phenomena PART II: SEMICONDUCTOR DEVICES 17h 31m remaining where (20) qp W Area A V Fig. 8 Basic setup to measure carrier concentration using the Hall effect. E. The Hall field Cy is proportional to the product of the current density and the I HW04_soll.pdf.pdf * HW02_sol.pdf (1).pdf * HW02_sol.pdf.pdf I IELTS (2).pdf POF Show all 12:13 AM Type here to search w』 人 22°C 22-Feb-22 !!! II --- DI
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E Reading list
2: Carrier Transport Phenomena
PART II: SEMICONDUCTOR DEVICES
17h 31m remaining
Fig. 6 Measurement of resistivity using a four-point probe.
104
300K
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Transcribed Image Text:M Pravallika Documents X Recommendations SP22: EE-257 Sec 01 Ask a Question C Prep for a test - EE 21 X O History O 2: Carrier Transport Ph X + learning.oreilly.com/library/view/semiconductor-devices-physics/9780470537947/09_chap02.html#fig8 Apps G Gmail 9 Марs YouTube Maps Solved PROBLEMS... Homework 3 - web... O Problem 4: An intri... A Update : P5. The electron co... Four Point Probe Re... 1: Energy Bands and Carrier Concentration in Therm... E Reading list 2: Carrier Transport Phenomena PART II: SEMICONDUCTOR DEVICES 17h 31m remaining Fig. 6 Measurement of resistivity using a four-point probe. 104 300K 103 Si GaAs 102 p-GaAs 10! p-Si n-GaAs 10- n-Si 10-2 10-3 104 1012 1013 1014 1015 1016 1017 1018 1019 1020 1021 Impurity Concentration (cm) Fig. 7 Resistivity versus impurity concentration³ for Si and GaAs. POF I HW04_soll.pdf.pdf * HW02_sol.pdf (1).pdf PDF * HW02_sol.pdf.pdf I IELTS (2).pdf Show all Type here to search 12:14 AM 22°C 22-Feb-22 !!! o 1. --- II Resistivity (2- cm)
Expert Solution
Step 1

It is given that:

W=0.05 cmA=1.25×10-3 cm-2I=2 mAB=2×10-4 Wbcm2H=10 mV

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