chip as defective or nondefective. Let X; = 0 if the chip is nondefective and X; = 1 if the chip is defective. The sample frac- tion defective is p = X₁ + X2 + ... + X100 100 What is the sampling distribution of the random variable P? 7.S13 WP A random variable x has probability density function 1 f(x) = = 203 0

Holt Mcdougal Larson Pre-algebra: Student Edition 2012
1st Edition
ISBN:9780547587776
Author:HOLT MCDOUGAL
Publisher:HOLT MCDOUGAL
Chapter11: Data Analysis And Probability
Section: Chapter Questions
Problem 8CR
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Answer questions 7.4.11, 7.4.12 and 7.4.13 respectively 

chip as defective or nondefective. Let X; = 0 if the chip is
nondefective and X; = 1 if the chip is defective. The sample frac-
tion defective is
p =
X₁ + X2 +
...
+ X100
100
What is the sampling distribution of the random variable P?
7.S13 WP A random variable x has probability density function
1
f(x) =
=
203
0<x<∞, 0<< ∞
Find the maximum likelihood estimator for 0.
Transcribed Image Text:chip as defective or nondefective. Let X; = 0 if the chip is nondefective and X; = 1 if the chip is defective. The sample frac- tion defective is p = X₁ + X2 + ... + X100 100 What is the sampling distribution of the random variable P? 7.S13 WP A random variable x has probability density function 1 f(x) = = 203 0<x<∞, 0<< ∞ Find the maximum likelihood estimator for 0.
7.S11 WP SS VS A random sample of 36 observations has
been drawn from a normal distribution with mean 50 and standard
deviation 12. Find the probability that the sample mean is in the
interval 47 ≤ X ≤ 53. Is the assumption of normality important?
Why?
7.S12 A manufacturer of semiconductor devices takes a ran-
dom sample of 100 chips and tests them, classifying each
Transcribed Image Text:7.S11 WP SS VS A random sample of 36 observations has been drawn from a normal distribution with mean 50 and standard deviation 12. Find the probability that the sample mean is in the interval 47 ≤ X ≤ 53. Is the assumption of normality important? Why? 7.S12 A manufacturer of semiconductor devices takes a ran- dom sample of 100 chips and tests them, classifying each
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