3. An aluminum thin film is deposited onto an 8" diameter silicon wafer by thermal evaporation from a crucible cup (it can only evaporate upwards and so it will coat a hemispherical shell above the crucible). The crucible has a diameter 1 cm, and the wafer is positioned directly over it with 0° angular tilt. Deposition occurs at 1.5 × 10-6 Torr. a) The thickness of the aluminum is measured to be 0.5 µm at the centre of the silicon wafer. The thickness at the edge of the wafer is 0.3 µm. Calculate the distance of the wafer from the crucible source? b) What is the rate of aluminum deposition onto the wafer, at the center of the wafer, if the deposition is done at 1100°C? Use aluminum density of 2.7 g/cm³.

Principles of Heat Transfer (Activate Learning with these NEW titles from Engineering!)
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Chapter11: Heat Transfer By Radiation
Section: Chapter Questions
Problem 11.3DP
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3. An aluminum thin film is deposited onto an 8" diameter silicon wafer by thermal
evaporation from a crucible cup (it can only evaporate upwards and so it will coat a
hemispherical shell above the crucible). The crucible has a diameter 1 cm, and the wafer is
positioned directly over it with 0° angular tilt. Deposition occurs at 1.5 × 10-6 Torr.
a) The thickness of the aluminum is measured to be 0.5 um at the centre of the silicon wafer.
The thickness at the edge of the wafer is 0.3 µm. Calculate the distance of the wafer from
the crucible source?
b) What is the rate of aluminum deposition onto the wafer, at the center of the wafer, if the
deposition is done at 1100°C? Use aluminum density of 2.7 g/cm³.
c) Will this evaporation processes result in good quality aluminum, and if not, how might you
improve it? Justify your answer.
Transcribed Image Text:3. An aluminum thin film is deposited onto an 8" diameter silicon wafer by thermal evaporation from a crucible cup (it can only evaporate upwards and so it will coat a hemispherical shell above the crucible). The crucible has a diameter 1 cm, and the wafer is positioned directly over it with 0° angular tilt. Deposition occurs at 1.5 × 10-6 Torr. a) The thickness of the aluminum is measured to be 0.5 um at the centre of the silicon wafer. The thickness at the edge of the wafer is 0.3 µm. Calculate the distance of the wafer from the crucible source? b) What is the rate of aluminum deposition onto the wafer, at the center of the wafer, if the deposition is done at 1100°C? Use aluminum density of 2.7 g/cm³. c) Will this evaporation processes result in good quality aluminum, and if not, how might you improve it? Justify your answer.
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