When a diffraction pattern of a crystalline solid is recorded using an X-ray beam of wavelength 0.26 nm, the first order diffraction peak occurs at a scattering angle of 35°. If the error in the measurements of angle and wavelength are 1° and 0.01 nm respectively, then determine t

When a diffraction pattern of a crystalline solid is recorded using an X-ray beam of wavelength 0.26 nm, the first order diffraction peak occurs at a scattering angle of 35°. If the error in the measurements of angle and wavelength are 1° and 0.01 nm respectively, then determine t

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