When a diffraction pattern of a crystalline solid is recorded using an X-ray beam of wavelength 0.26 nm, the first order diffraction peak occurs at a scattering angle of 35°. If the error in the measurements of angle and wavelength are 1° and 0.01 nm respectively, then determine t
When a diffraction pattern of a crystalline solid is recorded using an X-ray beam of wavelength 0.26 nm, the first order diffraction peak occurs at a scattering angle of 35°. If the error in the measurements of angle and wavelength are 1° and 0.01 nm respectively, then determine t
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When a diffraction pattern of a crystalline solid is recorded using an X-ray beam of wavelength 0.26 nm, the first order diffraction peak occurs at a scattering angle of 35°. If the error in the measurements of angle and wavelength are 1° and 0.01 nm respectively, then determine the error in measuring the interplanar spacing. (a) 22.86 nm (b) 32.38 nm (c) 15.2 nm (d) 13.2 nm
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