The following data refer to visual defects found at' inspection of 10 sam ples cf size 100. Use them to obtain upper ard lcwer ccnIrel hmits fer percentage delective in samples of 100. Represert the first ten sample results in the chart you prepare to show the central ine and çontrol limits. Sample No. No, of defectives : 2 1 : 1 2 3 4 1 3 9 10 2 0 7 8 Total 2 3 4 2 20

Advanced Engineering Mathematics
10th Edition
ISBN:9780470458365
Author:Erwin Kreyszig
Publisher:Erwin Kreyszig
Chapter2: Second-order Linear Odes
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The following data refer to visual defects found at
inspection of 10 sam ples of size 100. Use tbem to obtain upper
ard lcw er ccnIrel imits fer percentage defective in samples of
100. Represert the first ten sanm ple results in the chart
prepare to show the central ine and çontrol limits.
Jou
Sample No.
No, of defectives : 2 1
: 1 2
3
4 5
7
8.
9 10
Total
3
2
4
2
2
20
6 3
Transcribed Image Text:The following data refer to visual defects found at inspection of 10 sam ples of size 100. Use tbem to obtain upper ard lcw er ccnIrel imits fer percentage defective in samples of 100. Represert the first ten sanm ple results in the chart prepare to show the central ine and çontrol limits. Jou Sample No. No, of defectives : 2 1 : 1 2 3 4 5 7 8. 9 10 Total 3 2 4 2 2 20 6 3
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