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The first order diffraction peak of a crystalline solid occurs at a scattering angle of 30°
when the diffraction pattern is recorded using an x-ray beam of wavelength 0.15 nm. If
the error in measurements of the wavelength and the angle are 0.01 nm and 1°
respectively, then the error in calculating the inter-planar spacing will approximately be
(а) 1.1x107 пт
(b) 1.3x10 пт
(c) 2.5 x10 nm
(d) 2.0x 10> пт

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