*******************Q5://: Answer the following (only 3):*************************a. In the XRD technique the crystal angle must be change to measure the diffractionpattern of the sample under consideration. Why?b. To measure the absorbance or the transmittance of thin sample we can use asingle beamwith reference or double beamspectrophotometer without reference. Explain.spectrophotometerc. The density of states of crystalline and amorphous materials has differences inthe E vs. D (E) space. State it with diagram.d.At what angle will a diffracted beam emerge from the (111) planes of a facecentered cubic crystal of unit cell length 0.4 nm? Assume diffraction occurs inthe first order and that the x-ray wavelength is 0.3 nm.***********h = 6.626 x1034 J.s; h= 1.054 x1034 J.s; e = electron/hole charge = 1.602 ×10¹ C;

Note : According to Bartleyby expert guidelines when student has posted question with subparts we…

*********************** Q5://: Answer the following (only 3): ******** a. In the XRD technique the crystal angle must be change to measure the diffraction pattern of the sample under consideration. Why? b. To measure the absorbance or the transmittance of thin sample we can use a with reference or double beam single beam spectrophotometer spectrophotometer without reference. Explain. c. The density of states of crystalline and amorphous materials has differences in the E vs. D (E) space. State it with diagram.

*************** Q5://: Answer the following (only 3): a. In the XRD technique the crystal angle must be change to measure the diffraction pattern of the sample under consideration. Why? b. To measure the absorbance or the transmittance of thin sample we can use a with reference or double beam single beam spectrophotometer spectrophotometer without reference. Explain. c. The density of states of crystalline and amorphous materials has differences in the E vs. D (E) space. State it with diagram.

College Physics

11th Edition

ISBN:9781305952300

Author:Raymond A. Serway, Chris Vuille

Publisher:Raymond A. Serway, Chris Vuille

Chapter1: Units, Trigonometry. And Vectors

Section: Chapter Questions

Problem 1CQ: Estimate the order of magnitude of the length, in meters, of each of the following; (a) a mouse, (b)...

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Concept explainers

Compton effect

The incoming photons' energy must be in the range of an X-ray frequency to generate the Compton effect. The electron does not lose enough energy that reduces the wavelength of scattered photons towards the visible spectrum. As a result, with visible lights, the Compton effect is missing.

Recoil Velocity

The amount of backward thrust or force experienced by a person when he/she shoots a gun in the forward direction is called recoil velocity. This phenomenon always follows the law of conservation of linear momentum.

Question

*******************
Q5://: Answer the following (only 3):
*************************
a. In the XRD technique the crystal angle must be change to measure the diffraction
pattern of the sample under consideration. Why?
b. To measure the absorbance or the transmittance of thin sample we can use a
single beam
with reference or double beam
spectrophotometer without reference. Explain.
spectrophotometer
c. The density of states of crystalline and amorphous materials has differences in
the E vs. D (E) space. State it with diagram.
d.
At what angle will a diffracted beam emerge from the (111) planes of a face
centered cubic crystal of unit cell length 0.4 nm? Assume diffraction occurs in
the first order and that the x-ray wavelength is 0.3 nm.
***
********
h = 6.626 x1034 J.s; h= 1.054 x1034 J.s; e = electron/hole charge = 1.602 ×10¹ C;

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