Explain the method of retrospective study for collecting data. Consider the semiconductor wafer data in Table 4. Suppose those 10 wafers are selected randomly (without replacement) for an electrical test. Determine the probability that exactly 4 wafers have high contamination. Table 4: Wafers in Semiconductor Manufacturing Classified by Contamination and Location Location in Sputtering Tool Contamination Centre Edge Low 514 68 High 112 246 Total 626 314 Total 582 358

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Explain the method of retrospective study for collecting data.
Consider the semiconductor wafer data in Table 4. Suppose those 10 wafers
are selected randomly (without replacement) for an electrical test. Determine
the probability that exactly 4 wafers have high contamination.
Table 4: Wafers in Semiconductor Manufacturing Classified by
Contamination and Location
Location in Sputtering Tool
Centre Edge
514
68
112
246
626
314
Contamination
Low
High
Total
Total
582
358
Transcribed Image Text:Explain the method of retrospective study for collecting data. Consider the semiconductor wafer data in Table 4. Suppose those 10 wafers are selected randomly (without replacement) for an electrical test. Determine the probability that exactly 4 wafers have high contamination. Table 4: Wafers in Semiconductor Manufacturing Classified by Contamination and Location Location in Sputtering Tool Centre Edge 514 68 112 246 626 314 Contamination Low High Total Total 582 358
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