a. An average hole drift velocity of 103 cm/sec results when 2V is applied across a 1 cm long semiconductor bar. What is the hole mobility inside the bar? b. Name the two dominant carrier scattering mechanisms in nondegeneratedly doped semiconductors of device quality. c. For a give semiconductor the carrier mobilities in intrinsic material are (choose one: higher than, lower than, the same as) those in heavily doped material. Briefly explain why the mobilites in intrinsic material are (chosen answer) those in heavily doped material.

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a.
An average hole drift velocity of 103 cm/sec results when 2V is applied across a 1 cm long
semiconductor bar. What is the hole mobility inside the bar?
b. Name the two dominant carrier scattering mechanisms in nondegeneratedly doped
semiconductors of device quality.
c. For a give semiconductor the carrier mobilities in intrinsic material are (choose one: higher
than, lower than, the same as) those in heavily doped material. Briefly explain why the
mobilites in intrinsic material are (chosen answer) those in heavily doped material.
Transcribed Image Text:a. An average hole drift velocity of 103 cm/sec results when 2V is applied across a 1 cm long semiconductor bar. What is the hole mobility inside the bar? b. Name the two dominant carrier scattering mechanisms in nondegeneratedly doped semiconductors of device quality. c. For a give semiconductor the carrier mobilities in intrinsic material are (choose one: higher than, lower than, the same as) those in heavily doped material. Briefly explain why the mobilites in intrinsic material are (chosen answer) those in heavily doped material.
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