A technique used in observing trace elements, isotopes and atomic monolayers based on the secondary ions that are ejected from the sample. O XRD O AFM SEM O SIMS O XPS ONLO ELLIPSOMETRY
A technique used in observing trace elements, isotopes and atomic monolayers based on the secondary ions that are ejected from the sample. O XRD O AFM SEM O SIMS O XPS ONLO ELLIPSOMETRY
Physical Chemistry
2nd Edition
ISBN:9781133958437
Author:Ball, David W. (david Warren), BAER, Tomas
Publisher:Ball, David W. (david Warren), BAER, Tomas
Chapter22: Surfaces
Section: Chapter Questions
Problem 22.43E
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![A technique used in observing trace elements, isotopes and atomic
monolayers based on the secondary ions that are ejected from the
sample.
XRD
AFM
SEM
SIMS
ELLIPSOMETRY
XPS
NLO
It is a solid surface on which the stationary phase is bound or coated.*
mobile phase
column
> supporting medium
stationary phase
XPS can be used for the following analyses except-*
Contamination in the surface or the bulk of the sample
Functional group of the sample
Binding energy of electronic states
Thickness of materials
Density of electronic states](/v2/_next/image?url=https%3A%2F%2Fcontent.bartleby.com%2Fqna-images%2Fquestion%2Fd962ec3a-7a28-40fa-816f-e269248a136a%2F391a64ff-504a-4932-b3e5-1f92b87a20cf%2Fixgbej_processed.png&w=3840&q=75)
Transcribed Image Text:A technique used in observing trace elements, isotopes and atomic
monolayers based on the secondary ions that are ejected from the
sample.
XRD
AFM
SEM
SIMS
ELLIPSOMETRY
XPS
NLO
It is a solid surface on which the stationary phase is bound or coated.*
mobile phase
column
> supporting medium
stationary phase
XPS can be used for the following analyses except-*
Contamination in the surface or the bulk of the sample
Functional group of the sample
Binding energy of electronic states
Thickness of materials
Density of electronic states
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