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A technique used in observing trace elements, isotopes and atomic monolayers based on the secondary ions that are ejected from the sample. O XRD O AFM SEM O SIMS O XPS ONLO ELLIPSOMETRY

A technique used in observing trace elements, isotopes and atomic monolayers based on the secondary ions that are ejected from the sample. O XRD O AFM SEM O SIMS O XPS ONLO ELLIPSOMETRY

Chemistry
Chemistry
10th Edition
ISBN:9781305957404
Author:Steven S. Zumdahl, Susan A. Zumdahl, Donald J. DeCoste
Publisher:Steven S. Zumdahl, Susan A. Zumdahl, Donald J. DeCoste
Chapter1: Chemical Foundations
Section: Chapter Questions
Problem 1RQ: Define and explain the differences between the following terms. a. law and theory b. theory and...
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A technique used in observing trace elements, isotopes and atomic monolayers based on the secondary ions that are ejected from the sample. XRD AFM SEM SIMS ELLIPSOMETRY XPS NLO It is a solid surface on which the stationary phase is bound or coated.* mobile phase column > supporting medium stationary phase XPS can be used for the following analyses except-* Contamination in the surface or the bulk of the sample Functional group of the sample Binding energy of electronic states Thickness of materials Density of electronic states
Transcribed Image Text:A technique used in observing trace elements, isotopes and atomic monolayers based on the secondary ions that are ejected from the sample. XRD AFM SEM SIMS ELLIPSOMETRY XPS NLO It is a solid surface on which the stationary phase is bound or coated.* mobile phase column > supporting medium stationary phase XPS can be used for the following analyses except-* Contamination in the surface or the bulk of the sample Functional group of the sample Binding energy of electronic states Thickness of materials Density of electronic states
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