A batch of transistors contains 7% defectives. Each transistor is subjected to a test that correctly identifies a defective, but also misidentifies as defective about 10% of the non-defective transistors. Given that a randomly chosen transistor is declared defective by the tester, compute the probability that it is actually defective, find P(D | TD)? Denote D as the event of a defective. P(D) = 0.07; TD  the event of testing defective. Use Bayes’ Rule.   Question 5 options: a 0.8827 b 0.8835 c 0.8742 d 0.8999

Advanced Engineering Mathematics
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ISBN:9780470458365
Author:Erwin Kreyszig
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Chapter2: Second-order Linear Odes
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A batch of transistors contains 7% defectives. Each transistor is subjected to a test that correctly identifies a defective, but also misidentifies as defective about 10% of the non-defective transistors. Given that a randomly chosen transistor is declared defective by the tester, compute the probability that it is actually defective, find P(D | TD)?

Denote as the event of a defective. P(D) = 0.07; TD  the event of testing defective. Use Bayes’ Rule.

 

Question 5 options:

a

0.8827

b

0.8835

c

0.8742

d

0.8999

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