You deposit a sub-monolayer concentration of Cu colloid nanoparticles on a planar silicon wafer. You transfer the sample to a scanning electron microscope equipped with an energy dispersive detector (EDX) which is a bulk elemental x-ray method. After spending some time setting up the SEM conditions for EDX measurement you notice a predominantly strong Si peak, and an absence of Cu x-ray fluorescence signal. Explain why this happens, propose a solution

Chemistry
10th Edition
ISBN:9781305957404
Author:Steven S. Zumdahl, Susan A. Zumdahl, Donald J. DeCoste
Publisher:Steven S. Zumdahl, Susan A. Zumdahl, Donald J. DeCoste
Chapter1: Chemical Foundations
Section: Chapter Questions
Problem 1RQ: Define and explain the differences between the following terms. a. law and theory b. theory and...
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This is surface science.
You deposit a sub-monolayer concentration of Cu colloid nanoparticles on a planar silicon
wafer. You transfer the sample to a scanning electron microscope equipped with an energy
dispersive detector (EDX) which is a bulk elemental x-ray method. After spending some time
setting up the SEM conditions for EDX measurement you notice a predominantly strong Si peak,
and an absence of Cu x-ray fluorescence signal. Explain why this happens, propose a solution
Transcribed Image Text:You deposit a sub-monolayer concentration of Cu colloid nanoparticles on a planar silicon wafer. You transfer the sample to a scanning electron microscope equipped with an energy dispersive detector (EDX) which is a bulk elemental x-ray method. After spending some time setting up the SEM conditions for EDX measurement you notice a predominantly strong Si peak, and an absence of Cu x-ray fluorescence signal. Explain why this happens, propose a solution
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