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When a diffraction pattern of a crystalline solid is recorded using an X-ray beam of
wavelength 0.26 nm, the first order diffraction peak occurs at a scattering angle of 35°. If
the error in the measurements of angle and wayelength are 1° and 0.01 nm respectively,
then determine the error in measuring the interplanar spacing.
(a) 22.86 nm
(b) 32.38 nm
(c) 15.2 nm
(d) 13.2 nm

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