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True or False Questions : Non-conducting materials can be studied by scanning tunneling microscope(STM). 0 True 0 False Backscattered electron detection should be employed to detect different phases in a material. 0 True 0 False Backscattered electrons are analyzed by TEM. 0 True 0 False IR spectroscopy is used to determine functional groups/bonding in molecules. 0 True 0 False Backscattered electrons have lower energy than secondary electrons. 0 True 0 False Secondary electrons are used in SEM. 0 True 0 False Energy dispersive spectroscopy (EDS) analyzes x-rays. 0 True 0 False XRD peaks broaden as nanoparticle size decreases. 0 True 0 False X-ray diffraction (XRD) peak position shifts to higher 29 angles as the distance between adjacent crystal planes increases. 0 True 0 False scanning electron microscopy (SEM) exhibits higher resolution than transmission electron microscopy (TEM) 0 True O False The G-band in a Raman spectrum of CNTs is attributed to defects. 0 True O False EDS provides information about the chemical composition of a material. 0 True O False

True or False Questions : Non-conducting materials can be studied by scanning tunneling microscope(STM). 0 True 0 False Backscattered electron detection should be employed to detect different phases in a material. 0 True 0 False Backscattered electrons are analyzed by TEM. 0 True 0 False IR spectroscopy is used to determine functional groups/bonding in molecules. 0 True 0 False Backscattered electrons have lower energy than secondary electrons. 0 True 0 False Secondary electrons are used in SEM. 0 True 0 False Energy dispersive spectroscopy (EDS) analyzes x-rays. 0 True 0 False XRD peaks broaden as nanoparticle size decreases. 0 True 0 False X-ray diffraction (XRD) peak position shifts to higher 29 angles as the distance between adjacent crystal planes increases. 0 True 0 False scanning electron microscopy (SEM) exhibits higher resolution than transmission electron microscopy (TEM) 0 True O False The G-band in a Raman spectrum of CNTs is attributed to defects. 0 True O False EDS provides information about the chemical composition of a material. 0 True O False

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True or False Questions :

Non-conducting materials can be studied by scanning tunneling microscope(STM).

0 True

0 False

Backscattered electron detection should be employed to detect different phases in a material.

0 True

0 False

Backscattered electrons are analyzed by TEM.

0 True

0 False

IR spectroscopy is used to determine functional groups/bonding in molecules.

0 True

0 False

Backscattered electrons have lower energy than secondary electrons.

0 True

0 False

Secondary electrons are used in SEM.

0 True

0 False

Energy dispersive spectroscopy (EDS) analyzes x-rays.

0 True

0 False

XRD peaks broaden as nanoparticle size decreases.

0 True

0 False

X-ray diffraction (XRD) peak position shifts to higher 29 angles as the distance between adjacent crystal planes increases.

0 True

0 False

scanning electron microscopy (SEM) exhibits higher resolution than transmission electron microscopy (TEM)

0 True
O False

The G-band in a Raman spectrum of CNTs is attributed to defects.

0 True
O False

EDS provides information about the chemical composition of a material.

0 True
O False

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