The part of SEM that is responsible for the production of electrons. * Electron guns Condenser lens Secondary detector Electron beam A surface analysis technique used for determining elemental composition on surfaces of solid samples. AFM SEM XRD SIMS XPS A surface analysis technique that uses a cantilever to scan over a region of interest. The cantilever deflects towards or away from the surface due to the attractive and repulsive forces with the sample.

Chemistry
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ISBN:9781305957404
Author:Steven S. Zumdahl, Susan A. Zumdahl, Donald J. DeCoste
Publisher:Steven S. Zumdahl, Susan A. Zumdahl, Donald J. DeCoste
Chapter1: Chemical Foundations
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The part of SEM that is responsible for the production of electrons. *
Electron guns
Condenser lens
Secondary detector
Electron beam
A surface analysis technique used for determining elemental
composition on surfaces of solid samples.
AFM
SEM
XRD
SIMS
XPS
A surface analysis technique that uses a cantilever to scan over a region
of interest. The cantilever deflects towards or away from the surface due
to the attractive and repulsive forces with the sample.
AFM
SEM
XRD
XPS
SIMS
Transcribed Image Text:The part of SEM that is responsible for the production of electrons. * Electron guns Condenser lens Secondary detector Electron beam A surface analysis technique used for determining elemental composition on surfaces of solid samples. AFM SEM XRD SIMS XPS A surface analysis technique that uses a cantilever to scan over a region of interest. The cantilever deflects towards or away from the surface due to the attractive and repulsive forces with the sample. AFM SEM XRD XPS SIMS
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