show that a best critical region for testing H : 0 = 1 vs Ha : 0 = 2 is C = ((11, x2, ..., n) : c < II1 Ti).

Algebra & Trigonometry with Analytic Geometry
13th Edition
ISBN:9781133382119
Author:Swokowski
Publisher:Swokowski
Chapter10: Sequences, Series, And Probability
Section10.8: Probability
Problem 22E
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2) If X1, X2, ..., X, is a random sample from a distribution having p.d.f of
the form
f(r; 0) = 0xº-1, 0 <x < 1,
show that a best critical region for testing Ho : 0 = 1 vs H. : 0 = 2 is
C = ((1,72, ..., Tn) : c< II-1 *:).
1
Transcribed Image Text:2) If X1, X2, ..., X, is a random sample from a distribution having p.d.f of the form f(r; 0) = 0xº-1, 0 <x < 1, show that a best critical region for testing Ho : 0 = 1 vs H. : 0 = 2 is C = ((1,72, ..., Tn) : c< II-1 *:). 1
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