Pull-strength tests on 10 soldered leads for a semi-conductor device yield the following results in pounds force required to rupture the bond: 19.8, 12.7, 13.2, 16.9, 10.6, 18.8, 11.1, 14.3, 17.0, 12.5. Another set of 8 leads was tested after encapsulation to determine whether the pull-strength has been increased by encapsulation of the device, with the following results: 24.9, 22.8, 23.6, 22.1, 20.4, 21.6, 21.8, 22.5. Has the device encapsulation increased the mean pull-strength? Test using a = 0.05 and report the p-value.

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Pull-strength tests on 10 soldered leads for a semi-conductor device yield the
following results in pounds force required to rupture the bond: 19.8, 12.7, 13.2, 16.9, 10.6,
18.8, 11.1, 14.3, 17.0, 12.5. Another set of 8 leads was tested after encapsulation to determine
whether the pull-strength has been increased by encapsulation of the device, with the following
results: 24.9, 22.8, 23.6, 22.1, 20.4, 21.6, 21.8, 22.5. Has the device encapsulation increased
the mean pull-strength? Test using a = 0.05 and report the p-value.
Transcribed Image Text:Pull-strength tests on 10 soldered leads for a semi-conductor device yield the following results in pounds force required to rupture the bond: 19.8, 12.7, 13.2, 16.9, 10.6, 18.8, 11.1, 14.3, 17.0, 12.5. Another set of 8 leads was tested after encapsulation to determine whether the pull-strength has been increased by encapsulation of the device, with the following results: 24.9, 22.8, 23.6, 22.1, 20.4, 21.6, 21.8, 22.5. Has the device encapsulation increased the mean pull-strength? Test using a = 0.05 and report the p-value.
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