Powdered x-ray diffraction is conducted using x-ray of 0.154 nm wavelength to study a metallic material. The scanning angle (20) ranges from 0° to 130°. The material is known to be of single element and a FCC type of lattice with a lattice parameter of 0.380 nm. Find out: (1) At what angle (20) the second diffraction peak is located, and (2) how many peaks can be found in the range of 0 to 130°?. dt.

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9. Powdered x-ray diffraction is conducted using x-ray of 0.154 nm wavelength to study a
metallic material. The scanning angle (20) ranges from 0° to 130°. The material is known to
be of single element and a FCC type of lattice with a lattice parameter of 0.380 nm. Find out:
(1) At what angle (20) the second diffraction peak is located, and (2) how many peaks can be
found in the range of 0 to 130°?* dt.
Transcribed Image Text:9. Powdered x-ray diffraction is conducted using x-ray of 0.154 nm wavelength to study a metallic material. The scanning angle (20) ranges from 0° to 130°. The material is known to be of single element and a FCC type of lattice with a lattice parameter of 0.380 nm. Find out: (1) At what angle (20) the second diffraction peak is located, and (2) how many peaks can be found in the range of 0 to 130°?* dt.
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