In their study of X-ray diffraction, William and LawrenceBragg determined that the relationship among the wavelengthof the radiation (λ), the angle at which the radiationis diffracted (θ), and the distance between planes ofatoms in the crystal that cause the diffraction (d) is given bynλ = 2d sin θ. X rays from a copper X-ray tube that have awavelength of 1.54 Å are diffracted at an angle of 14.22 degreesby crystalline silicon. Using the Bragg equation, calculatethe distance between the planes of atoms responsiblefor diffraction in this crystal, assuming n = 1 (first-orderdiffraction).

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In their study of X-ray diffraction, William and Lawrence
Bragg determined that the relationship among the wavelength
of the radiation (λ), the angle at which the radiation
is diffracted (θ), and the distance between planes of
atoms in the crystal that cause the diffraction (d) is given by
nλ = 2d sin θ. X rays from a copper X-ray tube that have a
wavelength of 1.54 Å are diffracted at an angle of 14.22 degrees
by crystalline silicon. Using the Bragg equation, calculate
the distance between the planes of atoms responsible
for diffraction in this crystal, assuming n = 1 (first-order
diffraction).

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