Discuss the physical interfaces that may cause reflection and / or refraction of the waves that occur between a blast site and a structure of concern.( Please step by step answer and don't use ASI Answer )

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6. The diffraction angles of the first four peaks (first-order) of the XRD pattern for chromium are listed below (see next page). The metal has a BCC structure and monochromatic x- radiation having a wavelength of 0.0711 nm was used.

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Please answer Compare Column 1 with Column 2

The observed intensity of light (I) after passing through the sample cell is one-fourth the initial intensity (I0) from the light source. The absorbance (A) of the sample solution is a)0.097 b)0.602 c)25.0 d)0.250 e)1.398

Why are carbon dioxide and water vapor called selective absorbers?- PROVIDE AND ILLUSTRATION OR DRAWING

The part of SEM that is responsible for the production of electrons. * Electron guns Condenser lens Secondary detector Electron beam A surface analysis technique used for determining elemental composition on surfaces of solid samples. AFM SEM XRD SIMS XPS A surface analysis technique that uses a cantilever to scan over a region of interest. The cantilever deflects towards or away from the surface due to the attractive and repulsive forces with the sample. AFM SEM XRD XPS SIMS

Below are group of words. Tick the circle of the choices that is most likely not belonging to the group. SUBJECT: ANALYTIC CHEMESTRY