(d) In an STM, a negatively biased tip with a work function of 2.4 eV is used to scan a flat conducting surface. A tunnelling current of 3.2 x 10³ A is measured when the tip is 0.3 nm above the surface. The tunnelling probability at 0.3 nm is 8.58 x 10.³. Calculate the new tunnelling probability & the new tunnelling current when the tip moves so that it is 0.4 nm above the surface.
(d) In an STM, a negatively biased tip with a work function of 2.4 eV is used to scan a flat conducting surface. A tunnelling current of 3.2 x 10³ A is measured when the tip is 0.3 nm above the surface. The tunnelling probability at 0.3 nm is 8.58 x 10.³. Calculate the new tunnelling probability & the new tunnelling current when the tip moves so that it is 0.4 nm above the surface.
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Transcribed Image Text:(d) In an STM, a negatively biased tip with a work function of 2.4 eV is used to scan a flat
conducting surface. A tunnelling current of 3.2 x 10³ A is measured when the tip is 0.3 nm
above the surface. The tunnelling probability at 0.3 nm is 8.58 x 10.³.
Calculate the new tunnelling probability & the new tunnelling current when the tip moves so
that it is 0.4 nm above the surface.
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