Consider a MOS device with a p-type silicon substrate with N₁ = 1 X 10¹4 cm-³. The oxide Na thickness, tox, is 20 nm and the equivalent oxide charge Qs = 4 X 10-10 C/cm2². Use the SS figure above to find the metal-semiconductor work function differences and use them to find the threshold voltage for an aluminum gate. VT=0.882 V O VT=0.378 V O VT= -0.990 V O VT= -0.205 V
Consider a MOS device with a p-type silicon substrate with N₁ = 1 X 10¹4 cm-³. The oxide Na thickness, tox, is 20 nm and the equivalent oxide charge Qs = 4 X 10-10 C/cm2². Use the SS figure above to find the metal-semiconductor work function differences and use them to find the threshold voltage for an aluminum gate. VT=0.882 V O VT=0.378 V O VT= -0.990 V O VT= -0.205 V
Introductory Circuit Analysis (13th Edition)
13th Edition
ISBN:9780133923605
Author:Robert L. Boylestad
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Chapter1: Introduction
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Transcribed Image Text:&ms (V)
1.0
0.8
0.6
0.4
0.2
0
-0.2
-0.4
-0.6
-0.8
-1.0
1014
1015
p+ poly (n Si)
Au (n Si)
-p+ poly (p Si)
Au (p Si)
n poly (n Si)
+
Al (n Si)
Al (p Si)
n+ poly (p Si)
1016 1017
NB (cm-3)
1018
Consider a MOS device with a p-type silicon
substrate with N₁ = 1 X 10¹4 cm-³. The oxide
thickness, tox, is 20 nm and the equivalent
oxide charge 'SS 4 X 10-10 C/cm². Use the
figure above to find the metal-semiconductor
work function differences and use them to
find the threshold voltage for an
aluminum gate.

Transcribed Image Text:Consider a MOS device with a p-type silicon
substrate with N = 1 X 10¹4 cm-³. The oxide
Na
thickness, tox, is 20 nm and the equivalent
oxide charge Qs = 4 X 10-10 C/cm². Use the
'ss
figure above to find the metal-semiconductor
work function differences and use them to
find the threshold voltage for an
aluminum gate.
VT=0.882 V
O VT=0.378 V
OVT = -0.990 V
OVT = -0.205 V
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