An unknown material was ground to a fine powder and subjected to x-ay diffraction measurement using a Bruker V8 system with Cukα radiation with wavelength λ= 1.452 Å. The following 2θ values were recorded: 28.5o, 47.4o Identify the miller indices for the two XRD peak
An unknown material was ground to a fine powder and subjected to x-ay diffraction measurement using a Bruker V8 system with Cukα radiation with wavelength λ= 1.452 Å. The following 2θ values were recorded: 28.5o, 47.4o Identify the miller indices for the two XRD peak
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An unknown material was ground to a fine powder and subjected to x-ay diffraction measurement using a Bruker V8 system with Cukα radiation with wavelength λ= 1.452 Å. The following 2θ values were recorded:
28.5o, 47.4o
Identify the miller indices for the two XRD peak.
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