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A common unit of measure for failure rates of electronic components is the Failure unIT (FIT), expressed as a rate of failures per billion device hours. Another well known but less used measure is mean time between failures (MTBF), which is the av- erage time of operation of a particular component until it fails. Consider a 1 MB memory of a 16-bit microprocessor with 256K X 1 L `AMs. Calculate its MTBF as- suming 2000 FITS for each DRAM.

A common unit of measure for failure rates of electronic components is the Failure unIT (FIT), expressed as a rate of failures per billion device hours. Another well known but less used measure is mean time between failures (MTBF), which is the av- erage time of operation of a particular component until it fails. Consider a 1 MB memory of a 16-bit microprocessor with 256K X 1 L `AMs. Calculate its MTBF as- suming 2000 FITS for each DRAM.

Database System Concepts
Database System Concepts
7th Edition
ISBN:9780078022159
Author:Abraham Silberschatz Professor, Henry F. Korth, S. Sudarshan
Publisher:Abraham Silberschatz Professor, Henry F. Korth, S. Sudarshan
Chapter1: Introduction
Section: Chapter Questions
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A common unit of measure for failure rates of electronic components is the Failure unIT (FIT), expressed as a rate of failures per billion device hours. Another well known but less used measure is mean time between failures (MTBF), which is the av- erage time of operation of a particular component until it fails. Consider a 1 MB memory of a 16-bit microprocessor with 256K X 1 L `AMs. Calculate its MTBF as- suming 2000 FITS for each DRAM.
Transcribed Image Text:A common unit of measure for failure rates of electronic components is the Failure unIT (FIT), expressed as a rate of failures per billion device hours. Another well known but less used measure is mean time between failures (MTBF), which is the av- erage time of operation of a particular component until it fails. Consider a 1 MB memory of a 16-bit microprocessor with 256K X 1 L `AMs. Calculate its MTBF as- suming 2000 FITS for each DRAM.
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