(a) According to the De Broglie relation on wave-particle duality, the wavelength of electrons is a lot longer that the wavelength of photons. TRUE FALSE (b) In single-partice cryo-electron microscopy, samples are irradiated with an electron beam, and structural information is gained from the refraction of the incident electrons transmitted through a vitrified sample on a grid containing the biomolecule of interest. TRVE FALSE

MATLAB: An Introduction with Applications
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Author:Amos Gilat
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Chapter1: Starting With Matlab
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Explain the proposed answer!!
(a) According to the De Broglie relation on wave-particle duality, the wavelength of electrons is a lot
longer that the wavelength of photons.
TRUE
FALSE
(b) In single-particle cryo-electron microscopy, samples are irradiated with an electron beam, and
structural information is gained from the refraction of the incident electrons transmitted through a
vitrified sample on a grid containing the biomolecule of interest.
TRUE
FALSE
(c) Electrons used in single-particle cryo-electron microscopy have higher energy that the photons
used in X-ray crystallography. Sample damage is therefore an important factor to consider in single-
particle cryo-electron microscopy.
TRUE
FALSE
(d) Cryo-EM instruments with a higher accelerating voltage supply electrons with a smaller linear
momentum.
TRUE
FALSE
Transcribed Image Text:Explain the proposed answer!! (a) According to the De Broglie relation on wave-particle duality, the wavelength of electrons is a lot longer that the wavelength of photons. TRUE FALSE (b) In single-particle cryo-electron microscopy, samples are irradiated with an electron beam, and structural information is gained from the refraction of the incident electrons transmitted through a vitrified sample on a grid containing the biomolecule of interest. TRUE FALSE (c) Electrons used in single-particle cryo-electron microscopy have higher energy that the photons used in X-ray crystallography. Sample damage is therefore an important factor to consider in single- particle cryo-electron microscopy. TRUE FALSE (d) Cryo-EM instruments with a higher accelerating voltage supply electrons with a smaller linear momentum. TRUE FALSE
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