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(a) 0 (b) Section 3-9 Troubleshooting 39. Examine the conditions indicated in Figure 3-92, and identify the faulty gates. 1 0- 0 (c) D FIGURE 3-92 0 0 0. (d) 0 'D' (e) 0 (f) D 0

(a) 0 (b) Section 3-9 Troubleshooting 39. Examine the conditions indicated in Figure 3-92, and identify the faulty gates. 1 0- 0 (c) D FIGURE 3-92 0 0 0. (d) 0 'D' (e) 0 (f) D 0

Introductory Circuit Analysis (13th Edition)
Introductory Circuit Analysis (13th Edition)
13th Edition
ISBN:9780133923605
Author:Robert L. Boylestad
Publisher:Robert L. Boylestad
Chapter1: Introduction
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**Section 3-9 Troubleshooting** **39.** Examine the conditions indicated in Figure 3-92, and identify the faulty gates. **Figure 3-92 Explanation:** This figure illustrates six different logic gate scenarios labeled (a) through (f). Each scenario shows a specific type of logic gate along with its input and output values: - (a) NAND Gate: Inputs are 1 and 1; the output is 0. - (b) OR Gate: Inputs are 1 and 0; the output is 1. - (c) NOR Gate: Inputs are 0 and 0; the output is 0. - (d) NOR Gate: Inputs are 0, 1, and 1; the output is 0. - (e) AND Gate: Inputs are 1 and 0; the output is 0. - (f) OR Gate: Inputs are 1 and 1; the output is 0. To troubleshoot, analyze the logic operation for each gate and identify any discrepancies between expected and actual outputs to determine the faulty gates.
Transcribed Image Text:**Section 3-9 Troubleshooting** **39.** Examine the conditions indicated in Figure 3-92, and identify the faulty gates. **Figure 3-92 Explanation:** This figure illustrates six different logic gate scenarios labeled (a) through (f). Each scenario shows a specific type of logic gate along with its input and output values: - (a) NAND Gate: Inputs are 1 and 1; the output is 0. - (b) OR Gate: Inputs are 1 and 0; the output is 1. - (c) NOR Gate: Inputs are 0 and 0; the output is 0. - (d) NOR Gate: Inputs are 0, 1, and 1; the output is 0. - (e) AND Gate: Inputs are 1 and 0; the output is 0. - (f) OR Gate: Inputs are 1 and 1; the output is 0. To troubleshoot, analyze the logic operation for each gate and identify any discrepancies between expected and actual outputs to determine the faulty gates.
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