2 X-Ray Diffraction d sin e to detector incident X-rays Diffraction patterns produced by X-rays can be used to determine the atomic structure of crystals. Ina three-dimensional crystal, the diffraction peaks reveal the distance between planes of atoms. In this problem, we consider a one-dimensional a line of atoms. X-rays with a wavelength of 1 = 0.15nm are used in a diffraction experiment. The first diffraction peak occurs at an angle of 8.627°. (a) What is the separation between neighboring atoms? (b) At what angles will the next two peaks occur?
2 X-Ray Diffraction d sin e to detector incident X-rays Diffraction patterns produced by X-rays can be used to determine the atomic structure of crystals. Ina three-dimensional crystal, the diffraction peaks reveal the distance between planes of atoms. In this problem, we consider a one-dimensional a line of atoms. X-rays with a wavelength of 1 = 0.15nm are used in a diffraction experiment. The first diffraction peak occurs at an angle of 8.627°. (a) What is the separation between neighboring atoms? (b) At what angles will the next two peaks occur?
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Transcribed Image Text:2 X-Ray Diffraction
d sin e
to detector
incident X-rays
Diffraction patterns produced by X-rays can be used to determine the atomic structure of crystals. In a three-dimensional
crystal, the diffraction peaks reveal the distance between planes of atoms. In this problem, we consider a one-dimensional
crystal: a line of atoms.
X-rays with a wavelength of å = 0.15nm are used in a diffraction experiment. The first diffraction peak occurs at an
angle of 8.627°.
(a) What is the separation between neighboring atoms?
(b) At what angles will the next two peaks occur?
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