Answered: 1. The time to failure in hours of an…

Introductory Circuit Analysis (13th Edition)

13th Edition

ISBN:9780133923605

Author:Robert L. Boylestad

Publisher:Robert L. Boylestad

Chapter1: Introduction

Section: Chapter Questions

Problem 1P: Visit your local library (at school or home) and describe the extent to which it provides literature...

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Question

Answer all parts to the question please

1. The time to failure in hours of an electronic component
subjected to an accelerated life test is shown below.
127 132 129 128 125 133 136 135
135 138 142 135 124 129 127 140
130 125 128 145 121 133 124 128
134 140 148 141 156 125 129 132
135 133 129 136 146 142 137 129
a) Construct a stem-and-leaf plot for the data
b) Construct a histogram for the data
c) Construct a dotplot for the data.
d) Construct a boxplot for the data.
e) Determine the outliers in the data.

Expert Solution

Step 1

Answer-a

I have created stem and leaf plot using R-programming. The R-code and the output if stem and leaf plot is attached below.

> time<-c(127,132,129,128,125,133,136,135,135,138,142,135,124,129,127,140,130,125,128,145,121,133,124,128,134,140,148,141,156,125,129,132,135,133,129,136,146,142,137,129)
The decimal point is 1 digit(s) to the right of the |

12 | 144
12 | 5557788899999
13 | 0223334
13 | 55556678
14 | 00122
14 | 568
15 | 6

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