1-WHICH IS THE SENSOR? 2-WHICH IS THE 3-WHAT IS IT USED FOR? TRANSDUECER?

Elements Of Electromagnetics
7th Edition
ISBN:9780190698614
Author:Sadiku, Matthew N. O.
Publisher:Sadiku, Matthew N. O.
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Subject Name: Theory and design for Mechanical measurement

Here are 5 questions according to the figure.

1. Which is the sensor?
2. Which is the transducer?
3. What is it used for?
4. Is there any noise in measurement?
5. What is the uncontrollable variables?

Explanation of the Figure:

![Figure: Diagram of a Measurement System](https://example.com/diagram)

The diagram portrays a measurement system comprising several key components. 

1. **Detector and Feedback Electronics**: This component is at the top of the diagram and is linked to the other parts using arrows, indicating the direction of the signal or feedback.

2. **Laser**: Positioned upper right, the laser sends a beam towards a specific part of the system.

3. **Photodiodes**: Represented as rectangular bars, these photodiodes receive the reflected laser beam. 

4. **Cantilever and Tip**: At the bottom left, the cantilever and tip interact with the **Sample Surface**, representing the surface being measured. 

The system operates by utilizing the laser to fire a beam at the cantilever and tip, which then reflects back to the photodiodes. The changes in reflection detected by the photodiodes are processed by the detector and feedback electronics, providing measurements of the sample surface. 

This type of system is often used in precise material surface characterizations, such as in Atomic Force Microscopy (AFM).
Transcribed Image Text:Here are 5 questions according to the figure. 1. Which is the sensor? 2. Which is the transducer? 3. What is it used for? 4. Is there any noise in measurement? 5. What is the uncontrollable variables? Explanation of the Figure: ![Figure: Diagram of a Measurement System](https://example.com/diagram) The diagram portrays a measurement system comprising several key components. 1. **Detector and Feedback Electronics**: This component is at the top of the diagram and is linked to the other parts using arrows, indicating the direction of the signal or feedback. 2. **Laser**: Positioned upper right, the laser sends a beam towards a specific part of the system. 3. **Photodiodes**: Represented as rectangular bars, these photodiodes receive the reflected laser beam. 4. **Cantilever and Tip**: At the bottom left, the cantilever and tip interact with the **Sample Surface**, representing the surface being measured. The system operates by utilizing the laser to fire a beam at the cantilever and tip, which then reflects back to the photodiodes. The changes in reflection detected by the photodiodes are processed by the detector and feedback electronics, providing measurements of the sample surface. This type of system is often used in precise material surface characterizations, such as in Atomic Force Microscopy (AFM).
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