1) Energy dispersive x-ray spectroscopy (EDX) is a commonly used characterization technique in Materials Science to determine the elemental composition of materials. To do this, EDX measures the emitted characteristic x-rays from materials (e.g. Ka), generated due to the excitation of electrons from a lower energy shell to a higher energy one. Assume that you are working as a Materials Engineer in a company that produces cars. Your company has purchased 1 ton of Cr-Fe-Cu alloy to fabricate a certain part of the car. Your boss asks you to determine whether the material your company purchased is, in fact Cr-Fe-Cu alloy. If it there is another element present in the material, you will retum the purchased material and stop production. So, you perform EDX analysis on your material and you see that three x-ray energies are detected: 5416, 6406 and 8050 ev. Determine which elements are present in your material and decide whether you should send the purchased material back or continue production. Wavelength of Ka x-rays Flement (nm)

1) Energy dispersive x-ray spectroscopy (EDX) is a commonly used characterization technique in Materials Science to determine the elemental composition of materials. To do this, EDX measures the emitted characteristic x-rays from materials (e.g. Ka), generated due to the excitation of electrons from a lower energy shell to a higher energy one. Assume that you are working as a Materials Engineer in a company that produces cars. Your company has purchased 1 ton of Cr-Fe-Cu alloy to fabricate a certain part of the car. Your boss asks you to determine whether the material your company purchased is, in fact Cr-Fe-Cu alloy. If it there is another element present in the material, you will retum the purchased material and stop production. So, you perform EDX analysis on your material and you see that three x-ray energies are detected: 5416, 6406 and 8050 ev. Determine which elements are present in your material and decide whether you should send the purchased material back or continue production. Wavelength of Ka x-rays Flement (nm)