Lab Report_Template_EET130-1

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Feb 20, 2024

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EET130 Digital Systems I Instructor: Cameron Ruddy Lab 1 Signals and Number Systems Student Name(s): Brandon Walker Click or tap here to enter text. Honor Pledge: I pledge to support the Honor System of ECPI. I will refrain from any form of academic dishonesty or deception, such as cheating or plagiarism. I am aware that as a member of the academic community, it is my responsibility to turn in all suspected violators of the honor code. I understand that any failure on my part to support the Honor System will be turned over to a Judicial Review Board for determination. I will report to the Judicial Review Board hearing if summoned. Click or tap here to enter text. Brandon Walker Date: 2/4/2024 Adding your name here constitutes your agreement to the Honor Pledge as stated.

Contents Abstract ....................................................................................................................................................... 3 Introduction ................................................................................................................................................. 3 Part 1: Methods and Procedures .................................................................................................................. 4 Part 1: Results and Figures ...................................................................................................................... 4 Part 2: Methods and Procedures .................................................................................................................. 4 Part 2: Results and Figures ...................................................................................................................... 4 Conclusion ................................................................................................................................................... 5 References ................................................................................................................................................... 6 2

Abstract The aim of this experiment is to gain insight into the functioning of logic gates. There exist six distinct types of logic gates: AND, OR, NAND, NOR, XOR, and XNOR. Through the construction of a straightforward circuit and the analysis of a logic table, one can ascertain and anticipate the outcomes of the circuit. I ntroduction Logic gates play a crucial role in validating truth tables and manipulating binary numbers to achieve specific results. The six primary logic gates include AND, OR, NAND, NOR, XOR, and XNOR. When employed effectively with truth tables, logic gates offer a multitude of possibilities for contemporary applications. For instance, configuring a logic gate with an OR function could enable programming it to trigger an alarm if a car door or window is left open, enhancing security measures. 3

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Part 1: Methods and Procedures EET130 Digital Systems I Lab: Logic Gates I. Objective :  Verify the truth table for the basic logic gates.  Construct and test logic circuits II. Parts List : Circuit 1  1 – OR gate  2 – 1 KOhm resistors  2 – SPDT switches  1 – Digital probe  2 - VCC (5V)  2 - GND Circuit 2  1 – AND gate  2 – 1 KOhm resistors 4

 2 – SPDT switches  1 – Digital probe  2 - VCC (5V)  2 - GND Circuit 3  1 – 74LS32N (OR gate IC)  1 – 74LS04N (Hex Inverter IC)  1 – 1KOhm resistor  2 – SPDT switches  1 – Digital probe  1 - VCC (5V)  1 - GND Circuit 4  1 – 74LS08N (AND gate IC)  1 – 74LS04N (Hex Inverter IC)  1 – 1KOhm resistor  2 – SPDT switches  1 – Digital probe  1 - VCC (5V)  1 - GND 5

Circuit 5  Same as circuit 4 Circuit 6  Same as circuit 3 III. Introduction: This lab will demonstrate the properties of basic logic gates. It will also illustrate some of applications of Universal gates to implement functioning of other logic gates. IV. Procedures : 1. Write down “predicted output” values for Circuit 1 in Table 1 for given inputs. 2. Construct Circuit 1 shown in Figure 1 using components listed in parts list for Circuit 1. 3. For Circuit 1, change inputs A and B using SPDT switches and observe output using digital probe connected to output. Write down “measured output” values in Table 1. If there are any differences between “predicted” and “measured” output, find the error, and correct the problem. 6

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Figure 1: Circuit 1 Table 1: Circuit 1 results Input A Input B Predicted Output Measured Output 0 0 0 0 0 1 1 1 1 0 1 1 1 1 1 1 4. Write down “predicted output” values for Circuit 2 in Table 2 for given inputs. 5. Construct Circuit 2 shown in Figure 2 using components listed in parts list for Circuit 2. 6. For Circuit 2, change inputs A and B using SPDT switches and observe output using digital probe connected to output. Write down “measured output” values in Table 2. 7

If there are any differences between “predicted” and “measured” output, find the error, and correct the problem. 7. Sketch the 8. For Circuit 2, change inputs A, B, and C using SPDT switches and observe output using digital probe connected to output. Write down “measured output” values in Table 2. These values should be same as predicted values. If there are any differences between predicted and measured values, find the error and correct the problem. Figure 2: Circuit 2 Table 2: Circuit 2 results 8

Input A Input B Predicted Output Measured Output 0 0 0 0 0 1 0 0 1 0 0 0 1 1 1 1 9. Place 74LS32N and 74LS04N as shown in Figure 3 and make sure VCC (pin14) and GND (pin 7) pins of both ICs are connected to 5V and ground, respectively. 10. Refer to data sheet for both ICs for pin layout. Connect pins 1 and 2 for 74LS32N to SPDT switches (to change inputs to high or low). 11. Connect pin 3 of 74LS32N to pin 1 of the 74LS04N. Next, connect digital probe to pin 2 of 74LS04N. 12. For Circuit 3, change inputs using SPDT switches and observe output using digital probe. Write down “measured output” values in Table 3. Figure 3: Circuit 3 Table 3: Circuit 3 results 9

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Input A Input B Measured Output 0 0 1 0 1 0 1 0 0 1 1 0 13. Place 74LS04N and 74LS08N as shown in Figure 4 and make sure VCC (pin14) and GND (pin 7) pins of both ICs are connected to 5V and ground, respectively. 14. Refer to data sheet for both ICs for pin layout. Connect pins 1 and 3 for 74LS04N to SPDT switches (to change inputs to high or low). 15. Connect pin 2 of 74LS04N to pin 1 of the 74LS08N. Next, connect pin 4 of the 74LS04N to pin 2 of the 74LS08N. Observe output by connecting digital probe to pin 3 of 74LS08N. 16. For Circuit 4, change inputs using SPDT switches and observe output using digital probe. Write down “measured output” values in Table 4. Figure 4: Circuit 4 10

Table 4: Circuit 4 results Input A Input B Measured Output 0 0 1 0 1 0 1 0 0 1 1 0 17. Compare measured output in tables 3 and 4 and indicate the relationship between the two gates shown below. ________________________________ The two gates show the same logic table of each other meaning they are similar gates with different inputs and outputs but with the same logic. ___________________________________________ ___________________________________________________________________________ ___________________________________________________________________________ 18. Place 74LS08N and 74LS04N as shown in Figure 5 and make sure VCC (pin14) and GND (pin 7) pins of both ICs are connected to 5V and ground, respectively. 19. Refer to data sheet for both ICs for pin layout. Connect pins 1 and 2 for 74LS08N to SPDT switches (to change inputs to high or low). 20. Connect pin 3 of 74LS08N to pin 1 of the 74LS04N. Next, observe output by connecting digital probe to pin 2 of 74LS04N. 11

21. For Circuit 5, change inputs using SPDT switches and observe output using digital probe. Write down “measured output” values in Table 5. Figure 5: Circuit 5 Table 5: Circuit 5 results Input A Input B Measured Output 0 0 1 0 1 0 1 0 0 1 1 0 22. Connect 74LS04N and 74LS32N as shown in Figure 6 and make sure VCC (pin14) and GND (pin 7) pins of both ICs are connected to 5V and ground, respectively. 23. Refer to data sheet for both ICs for pin layout. Connect pins 1 and 3 for 74LS04N to SPDT switches (to change inputs to high or low). 12

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24. Connect pin 2 of 74LS04N to pin 1 of the 74LS32N. Next, connect pin 4 of 74LS04N to pin 2 of 74LS32N. Observe output by connecting digital probe to pin 3 of 74LS32N. 25. For Circuit 6, change inputs using SPDT switches and observe output using digital probe. Write down “measured output” values in Table 6. 26. Compare measured output in tables 5 and 6 and indicate the relationship between the two gates shown below. __________________________________ These both are different and or gates with different inputs and output causing the logic tables to be different. _________________________________________ ___________________________________________________________________________ ___________________________________________________________________________ 13

Figure 6: Circuit 6 Table 6: Circuit 6 results Input A Input B Measured Output 0 0 0 0 1 1 1 0 1 1 1 1 14

Conclusion Through the experimentation with AND, OR gates in the circuits, we gained valuable insights into digital logic behavior. By observing the measured output values in the logic tables, distinct input-output relationships were identified for each circuit, emphasizing the fundamental principles of logical operations and signal inversion in digital systems. These experiments not only provided hands-on experience with AND, OR gates but also underscored the importance of understanding gate functionalities in designing and analyzing digital circuits. 15

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