What type of hypothesis testing should be used? * O Chi-square Goodness of Fit Test O Chi-square Test on Independence 5 What are the null and alternative hypothesis? * HO: The presence of particles does not affect the quality of the wafers; H1: The presence of particles does affect the quality of the wafers HO: The presence of particles does affect the quality of the wafers; H1: The presence of particles does not affect the quality of the wafers What are the significance level and the type of test? * Da = 0.05, Right-tailed ) α-05, left-tailed a = 0.05, two-tailed

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What type of hypothesis testing should be used? *
O Chi-square Goodness of Fit Test
O chi-square Test on Independence
5
What are the null and alternative hypothesis? *
HO: The presence of particles does not affect the quality of the wafers; H1: The presence of particles does affect
the quality of the wafers
HO: The presence of particles does affect the quality of the wafers; H1: The presence of particles does not affect
the quality of the wafers
6
What are the significance level and the type of test? *
O a = 0.05, Right-tailed
O a = 0.05, left-tailed
O a = 0.05, two-tailed
Transcribed Image Text:What type of hypothesis testing should be used? * O Chi-square Goodness of Fit Test O chi-square Test on Independence 5 What are the null and alternative hypothesis? * HO: The presence of particles does not affect the quality of the wafers; H1: The presence of particles does affect the quality of the wafers HO: The presence of particles does affect the quality of the wafers; H1: The presence of particles does not affect the quality of the wafers 6 What are the significance level and the type of test? * O a = 0.05, Right-tailed O a = 0.05, left-tailed O a = 0.05, two-tailed
CASELET 1
The results of a study conducted as part of a yield-improvement effort at a semiconductor manufacturing
facility provided defect data for a sample of 450 wafers. The following contingency table presents a
summary of the responses to two questions: "Was a particle found on the die that produced the wafer?"
and "Is the wafer good or bad?" Use an alpha of 0.05.
Quality of Wafer
Bad
Particles
Good
Totals
Yes
14
36
50
No
320
80
400
Totals
334
116
450
Transcribed Image Text:CASELET 1 The results of a study conducted as part of a yield-improvement effort at a semiconductor manufacturing facility provided defect data for a sample of 450 wafers. The following contingency table presents a summary of the responses to two questions: "Was a particle found on the die that produced the wafer?" and "Is the wafer good or bad?" Use an alpha of 0.05. Quality of Wafer Bad Particles Good Totals Yes 14 36 50 No 320 80 400 Totals 334 116 450
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