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Vafer yield reveals how good you are at making chips. Find your values in tab 5. You are given the radius of a wafer in centimeters. Calculate its area. • Next you are told how often defects occur, expressed as one defect on average per area If the number is 4.0, then it means that a defect occurs once ever 4 square centimeters on average. Assume defects are perfectly evenly distributed, not clumped up. That is the value in the "sq cm per defect" column. Next you are given the size of the die you are trying to manufacture in width and heighth. Calculate the die area. • How many possible dies are there (whole or part) on this wafer based on the area of th wafer and the die size? Some of the dies are cut off around the edge of the wafer as we saw in class. The number of those partial dies that you should subtract from the total possible die count shown as “Partial Dies Excluded "

Vafer yield reveals how good you are at making chips. Find your values in tab 5. You are given the radius of a wafer in centimeters. Calculate its area. • Next you are told how often defects occur, expressed as one defect on average per area If the number is 4.0, then it means that a defect occurs once ever 4 square centimeters on average. Assume defects are perfectly evenly distributed, not clumped up. That is the value in the "sq cm per defect" column. Next you are given the size of the die you are trying to manufacture in width and heighth. Calculate the die area. • How many possible dies are there (whole or part) on this wafer based on the area of th wafer and the die size? Some of the dies are cut off around the edge of the wafer as we saw in class. The number of those partial dies that you should subtract from the total possible die count shown as “Partial Dies Excluded "

Database System Concepts
Database System Concepts
7th Edition
ISBN:9780078022159
Author:Abraham Silberschatz Professor, Henry F. Korth, S. Sudarshan
Publisher:Abraham Silberschatz Professor, Henry F. Korth, S. Sudarshan
Chapter1: Introduction
Section: Chapter Questions
Problem 1PE
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Wafer yield reveals how good you are at making chips. Find your values in tab 5. You are given the radius of a wafer in centimeters. Calculate its area. Next you are told how often defects occur, expressed as one defect on average per area. If the number is 4.0, then it means that a defect occurs once ever 4 square centimeters on average. Assume defects are perfectly evenly distributed, not clumped up. That is the value in the "sq em per defect" column. Next you are given the size of the die you are trying to manufacture in width and heighth. Calculate the die area. How many possible dies are there (whole or part) on this wafer based on the area of the wafer and the die size? Some of the dies are cut off around the edge of the wafer as we saw in class. The number of those partial dies that you should subtract from the total possible die count is shown as "Partial Dies Excluded." Calculate the new total, and from those, and the area per defect, calculate the number of dies these defects will spoil. They are your defective dies. Remember, you can't have a half of a die that is bad. One defect and it's bad. The remaining dies are good. From that, calculate your yield, the proportion of good dies of all that could be good. Use first the values in the P5-Wafer part 1 tab. Fill in the following table with the values you calculated with those values. In the second table, repeat the calculations using the inputs from the P5-Wafer part 2 tab. Remember you can only sell whole, good wafers. 7 Wafer Yield Part 1 Part 2 Wafer Area (cm2) 1521 1521 Die Area 3.51 2.86 Possible Dies Whole Dies Defective Dies Good Dies Yield (if 30%, express as 0.30)
Transcribed Image Text:Wafer yield reveals how good you are at making chips. Find your values in tab 5. You are given the radius of a wafer in centimeters. Calculate its area. Next you are told how often defects occur, expressed as one defect on average per area. If the number is 4.0, then it means that a defect occurs once ever 4 square centimeters on average. Assume defects are perfectly evenly distributed, not clumped up. That is the value in the "sq em per defect" column. Next you are given the size of the die you are trying to manufacture in width and heighth. Calculate the die area. How many possible dies are there (whole or part) on this wafer based on the area of the wafer and the die size? Some of the dies are cut off around the edge of the wafer as we saw in class. The number of those partial dies that you should subtract from the total possible die count is shown as "Partial Dies Excluded." Calculate the new total, and from those, and the area per defect, calculate the number of dies these defects will spoil. They are your defective dies. Remember, you can't have a half of a die that is bad. One defect and it's bad. The remaining dies are good. From that, calculate your yield, the proportion of good dies of all that could be good. Use first the values in the P5-Wafer part 1 tab. Fill in the following table with the values you calculated with those values. In the second table, repeat the calculations using the inputs from the P5-Wafer part 2 tab. Remember you can only sell whole, good wafers. 7 Wafer Yield Part 1 Part 2 Wafer Area (cm2) 1521 1521 Die Area 3.51 2.86 Possible Dies Whole Dies Defective Dies Good Dies Yield (if 30%, express as 0.30)
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