The thickness of the disks measured in the lab using the digital verniers resulted in the capability graph: Process Capability Report for Digi Verniers Process Data 2.85 LSL Target USL Sample Mean Sample N StDev(Overall) StDev(Within) PPM USL PPM Total 3.15 3.08026 38 0.0200657 0 LSL 0.00 0.00 0.00 2.88 2.92 2.96 3.00 3.04 3.08 3.12 Performance Observed Expected Overall Expected Within 0.00 255.02 255.02 The actual process spread is represented by 6 sigma. Answer the following questions: (i) Did the parts meet spec? (ii) What is the expected failure (Parts per million PPM)? (iii) How could the Ppk be improved? (iv) If it was possible to make this improvement what would the new Ppk be? USL Overall Within Overall Capability Pp 2.49 PPL 3.83 PPU 1.16 Ppk 1.16 Cpm Potential (Within) Capability Cp CPL CPU Cpk
The thickness of the disks measured in the lab using the digital verniers resulted in the capability graph: Process Capability Report for Digi Verniers Process Data 2.85 LSL Target USL Sample Mean Sample N StDev(Overall) StDev(Within) PPM USL PPM Total 3.15 3.08026 38 0.0200657 0 LSL 0.00 0.00 0.00 2.88 2.92 2.96 3.00 3.04 3.08 3.12 Performance Observed Expected Overall Expected Within 0.00 255.02 255.02 The actual process spread is represented by 6 sigma. Answer the following questions: (i) Did the parts meet spec? (ii) What is the expected failure (Parts per million PPM)? (iii) How could the Ppk be improved? (iv) If it was possible to make this improvement what would the new Ppk be? USL Overall Within Overall Capability Pp 2.49 PPL 3.83 PPU 1.16 Ppk 1.16 Cpm Potential (Within) Capability Cp CPL CPU Cpk
College Algebra (MindTap Course List)
12th Edition
ISBN:9781305652231
Author:R. David Gustafson, Jeff Hughes
Publisher:R. David Gustafson, Jeff Hughes
Chapter4: Polynomial And Rational Functions
Section4.6: Rational Functions
Problem 11SC: Find the mean hourly cost when the cell phone described above is used for 240 minutes.
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Transcribed Image Text:The thickness of the disks measured in the lab using the digital verniers resulted in the capability graph:
Process Capability Report for Digi Verniers
LSL
Target
USL
Process Data
2.85
Sample Mean
Sample N
StDev(Overall)
StDev(Within)
PPM <LSL
PPM > USL
PPM Total
3.15
3.08026
38
0.0200657
0
Observed
0.00
0.00
0.00
LSL
2.88 2.92 2.96 3.00 3.04 3.08 3.12
Performance
Expected Overall Expected Within
0.00
255.02
255.02
The actual process spread is represented by 6 sigma.
Answer the following questions:
(i) Did the parts meet spec?
(ii) What is the expected failure (Parts per million PPM)?
(iii) How could the Ppk be improved?
(iv) If it was possible to make this improvement what would the new Ppk be?
USL
Overall
Within
Overall Capability
Pp 2.49
PPL
3.83
PPU
1.16
1.16
Ppk
Cpm
Potential (Within) Capability
Cp
CPL
CPU
Cpk
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