The thickness in millimeter (mm) of a part used in a semiconductor is a critical dimension. It has been observed that the thickness is normally distributed with standard deviation approximately given by o = 0.006 mm. To keep a check on the manufacturing process, random samples of size n = 30 are taken periodically and the thickness is measured for each. Find the probability that the sample mean Y of the thickness will be within 0.002 mm of the true mean μ. Note: Please round your answer to 4 decimal places.

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The thickness in millimeter (mm) of a part used in a semiconductor is a critical dimension. It has been
observed that the thickness is normally distributed with standard deviation approximately given by
o = 0.006 mm. To keep a check on the manufacturing process, random samples of size n = 30 are
taken periodically and the thickness is measured for each.
Find the probability that the sample mean Y of the thickness will be within 0.002 mm of the true
mean μ.
Note: Please round your answer to 4 decimal places.
Transcribed Image Text:The thickness in millimeter (mm) of a part used in a semiconductor is a critical dimension. It has been observed that the thickness is normally distributed with standard deviation approximately given by o = 0.006 mm. To keep a check on the manufacturing process, random samples of size n = 30 are taken periodically and the thickness is measured for each. Find the probability that the sample mean Y of the thickness will be within 0.002 mm of the true mean μ. Note: Please round your answer to 4 decimal places.
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