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The S and R waveforms in the figure below are applied to two different gated latches. The ENABLE waveforms for the latches are shown as EN1 and EN2. Draw the output waveforms of Q1 and 02, Assuming S, R, and EN are all active HIGH. Which output is least prone to synchronization errors? Why? S R

The S and R waveforms in the figure below are applied to two different gated latches. The ENABLE waveforms for the latches are shown as EN1 and EN2. Draw the output waveforms of Q1 and 02, Assuming S, R, and EN are all active HIGH. Which output is least prone to synchronization errors? Why? S R

Introductory Circuit Analysis (13th Edition)
Introductory Circuit Analysis (13th Edition)
13th Edition
ISBN:9780133923605
Author:Robert L. Boylestad
Publisher:Robert L. Boylestad
Chapter1: Introduction
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**Title: Synchronization in Gated Latches: Analyzing Output Waveforms** The S and R waveforms in the figure below are applied to two **different gated latches**. The ENABLE waveforms for the latches are shown as **EN1** and **EN2**. Draw the output waveforms of **Q1** and **Q2**, assuming S, R, and EN are all active HIGH. Which output is least prone to synchronization errors? Why? **Diagram Explanation:** The diagram consists of multiple horizontal lines representing signal waveforms: 1. **S**: This line shows the set condition of the latch, with HIGH and LOW states. 2. **R**: This line indicates the reset condition, toggling between HIGH and LOW states. 3. **EN1**: The enable signal for the first latch, which controls when the latch is allowed to change based on the S and R inputs. 4. **EN2**: The enable signal for the second latch, similar in function to EN1 but for the second latch. 5. **Q1**: The expected output waveform for the first latch, based on the interaction of S, R, and EN1. 6. **Q2**: The expected output waveform for the second latch, determined by S, R, and EN2. **Analytical Task:** - **Output Waveform Derivation**: For each latch (Q1 and Q2), draw the waveform by observing when the enable signal (EN1 or EN2) is HIGH, allowing S and R to affect the output state. - **Synchronization Error Analysis**: Identify which of the two outputs (Q1 or Q2) is least prone to synchronization errors by examining the stability and timing of the enable signals in relation to S and R changes. This exercise highlights the critical role of enable signals in preventing synchronization errors in gated latches, crucial for efficient digital circuit design.
Transcribed Image Text:**Title: Synchronization in Gated Latches: Analyzing Output Waveforms** The S and R waveforms in the figure below are applied to two **different gated latches**. The ENABLE waveforms for the latches are shown as **EN1** and **EN2**. Draw the output waveforms of **Q1** and **Q2**, assuming S, R, and EN are all active HIGH. Which output is least prone to synchronization errors? Why? **Diagram Explanation:** The diagram consists of multiple horizontal lines representing signal waveforms: 1. **S**: This line shows the set condition of the latch, with HIGH and LOW states. 2. **R**: This line indicates the reset condition, toggling between HIGH and LOW states. 3. **EN1**: The enable signal for the first latch, which controls when the latch is allowed to change based on the S and R inputs. 4. **EN2**: The enable signal for the second latch, similar in function to EN1 but for the second latch. 5. **Q1**: The expected output waveform for the first latch, based on the interaction of S, R, and EN1. 6. **Q2**: The expected output waveform for the second latch, determined by S, R, and EN2. **Analytical Task:** - **Output Waveform Derivation**: For each latch (Q1 and Q2), draw the waveform by observing when the enable signal (EN1 or EN2) is HIGH, allowing S and R to affect the output state. - **Synchronization Error Analysis**: Identify which of the two outputs (Q1 or Q2) is least prone to synchronization errors by examining the stability and timing of the enable signals in relation to S and R changes. This exercise highlights the critical role of enable signals in preventing synchronization errors in gated latches, crucial for efficient digital circuit design.
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