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The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample size of n = 100, resulting in the following frequencies: Number of particles 0 Number of particles Frequency Frequency 1 8 12 1 2 9 4 23 3 10 12 11 53 45 11 12 1 15 13 2 6 18 14 1 7 10 What proportion of the sampled wafers had at least two particles? What proportion of the sampled wafers had at most ten particles? What proportion of the sampled wafers had less than four particles? What proportion of the sampled wafers had between four and nine particles, inclusive?

The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample size of n = 100, resulting in the following frequencies: Number of particles 0 Number of particles Frequency Frequency 1 8 12 1 2 9 4 23 3 10 12 11 53 45 11 12 1 15 13 2 6 18 14 1 7 10 What proportion of the sampled wafers had at least two particles? What proportion of the sampled wafers had at most ten particles? What proportion of the sampled wafers had less than four particles? What proportion of the sampled wafers had between four and nine particles, inclusive?

Mathematics For Machine Technology
Mathematics For Machine Technology
8th Edition
ISBN:9781337798310
Author:Peterson, John.
Publisher:Peterson, John.
Chapter29: Tolerance, Clearance, And Interference
Section: Chapter Questions
Problem 16A: Spacers are manufactured to the mean dimension and tolerance shown in Figure 29-12. An inspector...
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The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample size of n = 100, resulting in the following frequencies: Number of particles 0 Number of particles Frequency Frequency 1 8 12 1 2 9 4 23 3 10 12 11 53 45 11 12 1 15 13 2 6 18 14 1 7 10 What proportion of the sampled wafers had at least two particles? What proportion of the sampled wafers had at most ten particles? What proportion of the sampled wafers had less than four particles? What proportion of the sampled wafers had between four and nine particles, inclusive?
Transcribed Image Text:The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample size of n = 100, resulting in the following frequencies: Number of particles 0 Number of particles Frequency Frequency 1 8 12 1 2 9 4 23 3 10 12 11 53 45 11 12 1 15 13 2 6 18 14 1 7 10 What proportion of the sampled wafers had at least two particles? What proportion of the sampled wafers had at most ten particles? What proportion of the sampled wafers had less than four particles? What proportion of the sampled wafers had between four and nine particles, inclusive?
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