The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives. (a) Calculate a 95% two-sided Cl on the fraction of defective circuits produced by this particular tool. (b) Calculate a 95% upper confidence bound on the fraction of defective circuits.

3-T K A random sample of 100 observations from a population with standard deviation 75 yielded a sample mean of 114. Complete parts a through c below. Z= a. Test the null hypothesis that μ = 100 against the alternative hypothesis that µ> 100, using a = 0.05. Interpret the results of the test. What is the value of the test statistic? (Round to two decimal places as needed.) Find the p-value. p-value = (Round to three decimal places as needed.) State and interpret the results of the test. O A. Do not reject Ho. There is sufficient evidence to indicate that the true population mean is greater than 100 at α = 0.05. OB. Reject Ho. There is sufficient evidence to indicate that the true population mean is greater than 100 at α = 0.05. OC. Reject Ho. There is insufficient evidence to indicate that the true population mean is greater than 100 at x = 0.05. O D. Do not reject Ho. There is insufficient evidence to indicate that the true population mean is greater than 100 at a = 0.05. Z= COLE b.…

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