Table 2-2 Wafers Classified by Contamination and Location Number of Contamination Particles Center Edge Totals 0.30 0.10 0.40 0.15 0.05 0.20 0.10 0.05 0.15 0.06 0.04 0.10 0.04 0.01 0.05 007 003 010 34
Table 2-2 Wafers Classified by Contamination and Location Number of Contamination Particles Center Edge Totals 0.30 0.10 0.40 0.15 0.05 0.20 0.10 0.05 0.15 0.06 0.04 0.10 0.04 0.01 0.05 007 003 010 34
MATLAB: An Introduction with Applications
6th Edition
ISBN:9781119256830
Author:Amos Gilat
Publisher:Amos Gilat
Chapter1: Starting With Matlab
Section: Chapter Questions
Problem 1P
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Transcribed Image Text:Table 2-2 Wafers Classified by Contamination and Location
Number of
Contamination
Particles
Center
Edge
Totals
0.30
0.10
0.40
0.15
0.05
0.20
0.10
0.05
0.15
3
0.06
0.04
0.10
4
0.04
0.01
0.05
5 or more
0.07
0.03
0.10
Totals
0.72
0.28
1.00
6) Consider the data on wafer contamination and
location in the sputtering tool shown in the Table.
Assume that one wafer is selected at random
from this set. Let A denote the event that a wafer
contains four or more particles, and let B denote
the event that a wafer is from the center of the
sputtering tool. Determine P(B).
7) Determine P(A/B).
8) Determine P(A N B).
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