6 Six samples with individual observations have been collected on the oxide thickness of siliconwafers, as shown in the following tableSample54.357 5364.8462.15.59.66.51.5A two-sided tabular Cusum control chart is to be constructed for the data using a 40% headstart todetect a shift of lo. Assume the target thickness is 60, h = 4, and the standard deviation is 5. Thevalue of Ce is equal toOa 23b. 11.2C. 0d. 6e. 1.9 A two-sided tabular Cusum control chart is to be constructed for the data using a 40% headstart todetect a shift of 1a. Assume the target thickness is 60, h = 4, and the standard deviation is 5. It canbe concluded from the data that there is no evidence of a shift that is greater than:a 0.30aOb 0.100oc 0.250od. 1.000e. 0.50aA two-sided tabular Cusum control chart is to be constructed for the data to detect a shift of 1a.Assume the target thickness is 60, h = 4, and the standard deviation is 5. The value of ARL, isapproximatelya 8.34b. 16.31C. 3.22od. 0.52e 10,34

Name: 6 Six samples with individual observations have been collected on the
Uploaded: 2024-03-20T07:06:41.000Z
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Description: 6 Six samples with individual observations have been collected on the oxide thickness of siliconwafers, as shown in the following tableSample54.357 5364.8462.15.59.66.51.5A two-sided tabular Cusum control chart is to be constructed for the data using