Scenario: Integrated Circuit Integrated circuits are manufactured on silicon wafers through a process that involves a series of steps. An experiment was carried out to study the effect on the yield of using three methods in the cleansing step (coded to maintain confidentiality). The results are as follows: New1 New2 Standard 31 34 38 34 19 28 29 35 34 20 35 37 31 23 38 29 32 30 Source: Dau Etraced hom . Ramirez and W. Tam, "An Auologiste Model or lategrated Ciit Manufaturing" Amal of Qalty Techmolgy 2000, 32. 254-262. At the 0.05 level of signıficance, is there evidence of a difference in the mean yıeld among the methods used in the cleansing steps?
Scenario: Integrated Circuit Integrated circuits are manufactured on silicon wafers through a process that involves a series of steps. An experiment was carried out to study the effect on the yield of using three methods in the cleansing step (coded to maintain confidentiality). The results are as follows: New1 New2 Standard 31 34 38 34 19 28 29 35 34 20 35 37 31 23 38 29 32 30 Source: Dau Etraced hom . Ramirez and W. Tam, "An Auologiste Model or lategrated Ciit Manufaturing" Amal of Qalty Techmolgy 2000, 32. 254-262. At the 0.05 level of signıficance, is there evidence of a difference in the mean yıeld among the methods used in the cleansing steps?
MATLAB: An Introduction with Applications
6th Edition
ISBN:9781119256830
Author:Amos Gilat
Publisher:Amos Gilat
Chapter1: Starting With Matlab
Section: Chapter Questions
Problem 1P
Related questions
Question
![Scenario: Integrated Circuit
Integrated circuits are manufactured on silicon wafers through a process that involves a
series of steps. An experiment was carried out to study the effect on the yield of using
three methods in the cleansing step (coded to maintain confidentiality). The results are
as follows:
Newl New2
Standard
38
34
38
29
31
35
34
23
38
34
20
19
35
32
28
37
Source: Datu Extracted hom J. Ramirez und W. Tam, "An Aunologistie
Model for lategrated Cieit Manufacturing" mal of Quality
Technoingy, 2000, 32. pp. 254-262.
At the 0.05 level of significance, is there evidence of a difference in the mean yıeld
among the methods used in the cleansing steps?](/v2/_next/image?url=https%3A%2F%2Fcontent.bartleby.com%2Fqna-images%2Fquestion%2Fbc82ff18-23ca-4d0e-9fbb-ba10072ab2c6%2F9ea67db0-2874-43b7-a88a-89919f5d437b%2Fbfvtcjj_processed.jpeg&w=3840&q=75)
Transcribed Image Text:Scenario: Integrated Circuit
Integrated circuits are manufactured on silicon wafers through a process that involves a
series of steps. An experiment was carried out to study the effect on the yield of using
three methods in the cleansing step (coded to maintain confidentiality). The results are
as follows:
Newl New2
Standard
38
34
38
29
31
35
34
23
38
34
20
19
35
32
28
37
Source: Datu Extracted hom J. Ramirez und W. Tam, "An Aunologistie
Model for lategrated Cieit Manufacturing" mal of Quality
Technoingy, 2000, 32. pp. 254-262.
At the 0.05 level of significance, is there evidence of a difference in the mean yıeld
among the methods used in the cleansing steps?
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