- sample at 300 K is doped wit s with energy Eph> E=rsjare t /CH, it was determined that ti a of impurities, the total conce-
- sample at 300 K is doped wit s with energy Eph> E=rsjare t /CH, it was determined that ti a of impurities, the total conce-
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![A Si semiconductor sample at 300 K is doped with N=1×10 cm°,a N= 1%105 cm² are then added to
the sample, photons with energy Eph > E- sare then incident on the sample resulting in 1×10° excess
electron-hole pairs /cm, it was determined that the minority carrier diffusion length is 1×10° cm, assuming
complete ionization of impurities, the total concentration of the minority carriers at i = 500 ns in the sample
will be:
OA 1.27e6 /cm^3
OB. 3670 /cm^3
OC.0 /cm^3
OD.7.85e6 /cm^3
DE 3.67e-9 /cm^3](/v2/_next/image?url=https%3A%2F%2Fcontent.bartleby.com%2Fqna-images%2Fquestion%2Ff303f774-f1ad-4d34-b1d7-7f5a824de2b3%2Fc1f3434d-683e-4cba-88ca-3e27ac1b8ed8%2Fw31z8bmh_processed.jpeg&w=3840&q=75)
Transcribed Image Text:A Si semiconductor sample at 300 K is doped with N=1×10 cm°,a N= 1%105 cm² are then added to
the sample, photons with energy Eph > E- sare then incident on the sample resulting in 1×10° excess
electron-hole pairs /cm, it was determined that the minority carrier diffusion length is 1×10° cm, assuming
complete ionization of impurities, the total concentration of the minority carriers at i = 500 ns in the sample
will be:
OA 1.27e6 /cm^3
OB. 3670 /cm^3
OC.0 /cm^3
OD.7.85e6 /cm^3
DE 3.67e-9 /cm^3
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